| The IL1440-A
Photoresist Radiometer system was designed for direct
measurement of the UV and blue visible irradiance
used for exposing photoresist coated substrates
in test and production environments. The low profile
(12.5 mm high) XRL probe can be placed right inside
most exposure systems.
The IL1740-A
Photoresist Research Radiometer provides unmatched
versatility and power for photoresist research.
Interchangeable filters and multiple sensitivity
factors, as well as a variety of I/O options, makes
this system ideal for researchers and development
engineers of photoresist equipment.
|
The IL1440-B
Photoresist Radiometer and the IL1740-B
Research Radiometer systems employ UV filtering
designed specifically for photoresist applications
requiring a peak sensitivity in the UVA and subdued
response in the blue. The 'B' response is also useful
for isolating the 365 nm mercury line.
The IL1741 and IL1441
Photoresist Radiometer systems include the new "Super
Slim" UV Probe, for use in very low profile
applications, such as printed circuit board and
printing plate exposure assemblies. The probe is
a mere 2 mm thick, the thickness of a printed circuit
board. |